Determination of optical properties of thin organic films by spectroellipsometry |
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| Affiliation: | 1. Bruno Kessler Foundation (FBK), Center for Materials and Microsystems (CMM), via Sommarive 18, I-38123 Trento, Italy;2. Institute of Biophysics, Trento Unit, National Research Council (IBF-CNR), via alla Cascata 56/C, I-38123 Trento, Italy;3. Department CIBIO, Laboratory of Molecular and Cellular Neurobiology, University of Trento, Via Sommarive 9, I-38123 Trento, Italy;4. Institute of Materials for Electronics and Magnetism, Trento Unit, National Research Council (IMEM–CNR), Via alla Cascata 56/C, I-38123 Trento, Italy;5. Department of Industrial Engineering, University of Trento, via Sommarive 14, I-38123 Trento, Italy;1. Tower Semiconductor Ltd, 23105 Migdal HaEmek, Israel;2. Technion-Israeli Institute of Technology, Haifa, 3200003, Israel;1. Engineering and Material Science (PIPE), Federal University of Paraná (UFPR), POB 19011, ZC 81531-990, Curitiba, PR, Brazil;2. Department of Chemistry, Federal University of Paraná (UFPR), POB 19081, ZC 81531-990 Curitiba, PR, Brazil;3. Lactec Institute, Federal University of Paraná (UFPR), POB 19067, ZC 81531-980 Curitiba, PR, Brazil;4. Institute of Chemistry, Federal University of Rio de Janeiro (UFRJ), ZC 21941-909 Rio de Janeiro, RJ, Brazil;5. Department of Physics, Federal University of Paraná (UFPR), POB 19044, ZC 81531-990 Curitiba, PR, Brazil |
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| Abstract: | Organic thin films show considerable promise for a number of bioelectronic applications, as they exhibit a wide variety of properties depending on the composition, the electronic structure and the microstructure. In this paper we discuss methods and applications of spectroellipsometry towards obtaining this type of information about thin films. Topics include methods of determining both the thickness and the dielectric properties of thin organic films and methods of determining microstructural information such as void fractions from these data. We conclude by indicating possible directions for future optical characterization work in this field. Examples are given throughout. |
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