首页 | 本学科首页   官方微博 | 高级检索  
     


Fault detection in CMOS circuits by consumption measurement
Authors:Jacomino  M Rainard  J-L David  R
Affiliation:Lab. d'Autom. de Grenoble, Saint-Martin d'Heres ;
Abstract:Some testing problems in CMOS circuits are presented, including stuck-open and stuck-on faults, bridging faults, and excessive leakage in dynamic CMOS circuits. It is shown that the current consumption of a faulty CMOS circuit is several orders of magnitude greater than that of the fault-free circuit: hence, consumption measurement may be a suitable way of testing. Test by consumption measurement provides improved controllability and observability of some faults in comparison with the logic test
Keywords:
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号