Preparation and characterization of carbon-sulfur surface compounds
Authors:
H.Chang Chin
Affiliation:
Corporate Research-Science Laboratories, Exxon Research and Engineering Company, P.O. Box 45, Linden, NJ 07036, U.S.A.
Abstract:
Carbon-sulfur surface compounds (CχS), in which sulfur is chemically bound, have been prepared with a sulfur content greater than 30 wt.%. X-Ray diffractometry and electron microscopy show that the structure of the material is similar to that of disordered carbons. CχS compounds are chemically stable in base and after an initial loss of several per cent of sulfur, they are stable in strong acids such as HCl and HNO3. In inert atmosphere, no measurable loss of sulfur was detected after being heated to 700°C. The XPS spectra (C1s,: 284.3 eV; S2p3/2: 163.7 eV) and the Fourier transform IR absorption spectra (1180,1550 cm?1) of CχS materials indicate no significant charge separation in carbon-sulfur bonds. Furthermore, these results suggest that, on CχS, carbon-sulfur surface groups exist in the form of thiocarbonyls, C and thiolactones, C, analogous to carbonyls and lactones existing on activated carbons.
