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Ion-beam-induced-charge characterisation of particle detectors |
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| Authors: | C. Yang D. N. Jamieson S. M. Hearne C. I. Pakes B. Rout E. Gauja A. J. Dzurak R. G. Clark |
| Affiliation: | a Centre for Quantum Computer Technology, Microanalytical Research Centre, School of Physics, University of Melbourne, Parkville, Vic. 3010, Australia b Centre for Quantum Computer Technology, University of New South Wales, Sydney 2052, Australia |
| Abstract: | Ion-beam-induced-charge collection (IBIC) in a nuclear microprobe has been used to characterise detectors for the measurement of particles over a median energy range (100 keV–1 MeV). Three standard detector devices have been studied: a PIPS detector with a buried (ion-implanted) junction structure, a Schottky barrier junction device and a PN-junction photodiode. A 2.0 MeV focussed helium ion beam was used to probe the active area of each device with a spatial resolution 1–2 μm, to quantify the thickness of the dead layer, the charge collection response and the reduction in charge collection efficiency induced by ion-beam damage. |
| Keywords: | IBIC Nuclear microprobe Dead layer Charge collection efficiency Pulse height defects Ion-beam damage |
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