| Philips 17RF 显示管的着陆系统偏差分析 |
| |
| 引用本文： | 何靖. Philips 17RF 显示管的着陆系统偏差分析[J]. 电子器件, 2003, 26(3): 256-259 |
| |
| 作者姓名： | 何靖 |
| |
| 作者单位： | 华飞彩色显示系统有限公司品保部,南京,210028 |
| |
| 摘 要： | 目前,对彩色显示管的分辨率和色纯的要求越来越高,而电子束的着屏(Landing)误差是影响彩色显示管的色纯的关键因素之一。我们通过ITC全过程中对5只采样管在不同条件下的着屏误差(Landing error)进行追踪测量,分析了华飞17’RF CRT在A0C(冠捷显示器厂)生产线上的色纯误差。在得到AOC产线最佳Parity效果的前提下,在AOC匹配部对色纯进行适当的预置。
|
| 关 键 词： | 彩色显示管 色纯 着屏误差 效应 |
| 文章编号： | 1005-9490(2003)03-0256-04 |
| 修稿时间： | 2003-05-05 |
Philips 17"RF CRT Landing System Difference Analysis |
| |
| HE Jing. Philips 17"RF CRT Landing System Difference Analysis[J]. Journal of Electron Devices, 2003, 26(3): 256-259 |
| |
| Authors: | HE Jing |
| |
| Abstract: | At the present, customer have higher and higher requirement for resolution and color purity of CRT. As one of the most important factor of influencing purity, the electronic beam landing error is concerned. The 5 pieces 17" RF samples landing error in all ITC process are investigated in the different conditions, In order to get best purity performance in AOC product line, the right purity offset was proposed by analyzing these data. |
| |
| Keywords: | CRT purity landing effect |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
| 点击此处可从《电子器件》浏览原始摘要信息 |
|
点击此处可从《电子器件》下载全文 |
