| Microstructural evolution of aluminum alloy 3003 during annealing |
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| 引用本文： | 吴文祥 张新明 孙德勤 胡国强 刘国金. Microstructural evolution of aluminum alloy 3003 during annealing[J]. 中国有色金属学会会刊, 2006, 16(A03): 1309-1313 |
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| 作者姓名： | 吴文祥 张新明 孙德勤 胡国强 刘国金 |
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| 作者单位： | [1]Suzhou Institute for Nonferrous Metals Processing Technology, Suzhou 215026, China [2]School of Materials Science and Engineering, Central South University, Changsha 410083, China |
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| 基金项目： | Foundation item： Projcct（2006KJA08） supported by the Science and Technology Development Foundation of CHALC0 |
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| 摘 要： | The microstrucmral evolution of cold-rolled aluminum alloy 3003 during annealing was investigated by means of micro-hardness measurement, electrical resistivity measurement, optical microscopy and transmission electron microscopy. The interaction of recrystallization and precipitation of aluminum alloy 3003 was also discussed. The results show that the recrystallized grain size of cold-rolled aluminum alloy 3003 is strongly affected by precipitation during annealing, When precipitation occurs prior to recrystallization at low temperature（300 ℃）, the grain structure becomes coarse, and the precipitation process is affected by the presence of lattice defects, i.e. high cold reduction results in a large number of precipitates. When annealing at 500 ℃, however, for the recrystallization is prior to precipitation, the precipitation is independent of cold deformation reduction and a fine, equiaxed grain structure is obtained.
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| 关 键 词： | 铝合金 微观结构 重结晶作用 电阻 |
| 收稿时间： | 2006-07-28 |
| 修稿时间： | 2006-09-15 |
Microstructural evolution of aluminum alloy 3003 during annealing |
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| WU Wen-xiang, ZHANG Xin-ming, SUN De-qin, HU Guo-qiang, LIU Guo-jin. Microstructural evolution of aluminum alloy 3003 during annealing[J]. Transactions of Nonferrous Metals Society of China, 2006, 16(A03): 1309-1313 |
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| Authors: | WU Wen-xiang ZHANG Xin-ming SUN De-qin HU Guo-qiang LIU Guo-jin |
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| Abstract: | |
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| Keywords: | aluminum alloy 3003 microstructural evolution recrystallization precipitation electrical resistivity |
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