| 基于边界扫描的非完全BS电路板测试诊断技术 |
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| 引用本文： | 王宁,董兵. 基于边界扫描的非完全BS电路板测试诊断技术[J]. 半导体技术, 2005, 30(12): 38-41 |
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| 作者姓名： | 王宁 董兵 |
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| 作者单位： | 空军第一航空学院,河南,信阳,464000;空军第一航空学院,河南,信阳,464000 |
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| 摘 要： | 由BS器件和非BS器件组装的非完全BS电路板仍将在今后相当长时间内广泛存在,如何对它们应用边界扫描测试是板级边界扫描测试技术需要研究的关键问题.本文从非完全BS电路板的测试性优化设计入手,举例说明了基于边界扫描的非完全BS电路板测试诊断技术的原理和过程.
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| 关 键 词： | 边界扫描 非完全BS电路板 测试性优化设计 |
| 文章编号： | 1003-353X(2005)12-0038-04 |
| 收稿时间： | 2005-07-25 |
| 修稿时间： | 2005-07-25 |
The Test & Diagnosis Techniques of Part-BS Board Based on Boundary Scan |
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| WANG Ning,DONG Bing. The Test & Diagnosis Techniques of Part-BS Board Based on Boundary Scan[J]. Semiconductor Technology, 2005, 30(12): 38-41 |
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| Authors: | WANG Ning DONG Bing |
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| Affiliation: | The First Aviation College of Air Force, Henan Xinyang 464000 China |
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| Abstract: | The part-BS PCB boards composed of BS chips and non-BS chips will exist widely for a long time, how to test these boards using boundary scan technique remains a key problem. In this paper, some optimal design methods for testability were proposed firstly, and then the principle and process of boundary scan test on part-BS boards were showed by way of illustration. |
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| Keywords: | boundary scan(BS) part-BS board optimal design for testability |
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