Enhancement of the lifetime in organic light-emitting devices fabricated utilizing wide-bandgap-impurity-doped emitting layers

The degradation behaviors of the electrical and the optical properties of organic light-emitting devices (OLEDs) fabricated with an emitting layer (EML) doped with or without a wide-bandgap-impurity were investigated. The OLEDs with a wide-bandgap-doped Alq₃ EML were more stable than those with an undoped Alq₃ EML. The existence of the doped wide-bandgap-impurity in the EML decreased the trap-charge density in the EML, resulting in an increase in the number of electrons in the Alq₃ EML. That increases in the number of electron in the Alq₃ EML for the OLEDs with a wide-bandgap-impurity decreased the staying time of the holes in the Alq₃ EML, resulting in an enhanced lifetime for the OLEDs. These results indicate that OLEDs with a wide-bandgap-impurity-doped EML hold promise for potential applications in long-lifetime OLED displays.