| 相移电子散斑干涉法测量面内变形 |
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| 引用本文： | 刘中本 卢石镐. 相移电子散斑干涉法测量面内变形[J]. 西安工业学院学报, 1994, 14(2): 85-89 |
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| 作者姓名： | 刘中本 卢石镐 |
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| 作者单位： | 西安工业学院，韩国电子通讯研究所 |
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| 摘 要： | 叙述了相移式电子散斑干涉法测量面内变形的原理、电子散斑图的计算机处理方法及测量例．采用分段多次测量可以扩大面内变形的测量范围，和一般电子散斑干涉术相比，相移式电子散斑干涉法提高了相关条纹位相的计算精度，因而提高了面内变形的测量精度，并可得到面内变形的三维立体图．
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| 关 键 词： | 干涉测量法，相移，散斑，电子散斑，相关条纹，面内变形 |
Measurement of in-Plane deformation by phase-shifting ESPI |
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| Liu ZhongBen,SEOKHO NOH. Measurement of in-Plane deformation by phase-shifting ESPI[J]. Journal of Xi'an Institute of Technology, 1994, 14(2): 85-89 |
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| Authors: | Liu ZhongBen SEOKHO NOH |
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| Affiliation: | Liu ZhongBen;SEOKHO NOH |
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| Abstract: | The principle of in-Plane deformation measurement by Phase-shiftting electronicspeckle pattern interometry (ESPI) and the method of computer data processing ofelectronic speckle patterns have been described and an example is given in this paper. Themeasuring range can be extended by multiple measurements in sections. Compared withordinary ESPI,the phase-shifting method gives high computing accuracy of correlationfringes' phase, there for the measurement accuracy of in-plane deformation isimproved. In addition, the 3-D contour map of in-plane deformation can also beobtained. |
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| Keywords: | Phase-shift interferometry speckle ESPI correlation fringe in-plane deformation |
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