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Atomic-scale structure of irradiated GaN compared to amorphised GaP and GaAs
Authors:MC Ridgway  SE Everett  CJ Glover  SM Kluth  P Kluth  B Johannessen  ZS Hussain  DJ Llewellyn  GJ Foran  G de M Azevedo
Affiliation:

aDepartment of Electronic Materials Engineering, Australian National University, Canberra, Australia

bAustralian Nuclear Science and Technology Organization, Menai, Australia

cLaboratorio Nacional de Luz Sincrotron, Campinas, Brazil

Abstract:We have compared the atomic-scale structure of ion irradiated GaN to that of amorphised GaP and GaAs. While continuous and homogenous amorphised layers were easily achieved in GaP and GaAs, ion irradiation of GaN yielded both structural and chemical inhomogeneities. Transmission electron microscopy revealed GaN crystallites and N2 bubbles were interspersed within an amorphous GaN matrix. The crystallite orientation was random relative to the unirradiated epitaxial structure, suggesting their formation was irradiation-induced, while the crystallite fraction was approximately constant for all ion fluences beyond the amorphisation threshold, consistent with a balance between amorphisation and recrystallisation processes. Extended X-ray absorption fine structure measurements at the Ga K-edge showed short-range order was retained in the amorphous phase for all three binary compounds. For ion irradiated GaN, the stoichiometric imbalance due to N2 bubble formation was not accommodated by Ga–Ga bonding in the amorphous phase or precipitation of metallic Ga but instead by a greater reduction in Ga coordination number.
Keywords:Ion irradiation  Amorphous  EXAFS  GaN  GaP  GaAs
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