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| IEEE 1149.4标准实验测试结构设计和扩展研究 | |
| 引用本文： | 刘林生,张东,陈建新. IEEE 1149.4标准实验测试结构设计和扩展研究[J]. 电子测试, 2012, 0(5): 1-6 |
| 作者姓名： | 刘林生 张东 陈建新 |
| 作者单位： | 1. 北京自动测试技术研究所,北京100088／北京工业大学电子信息与控制工程学院,北京100124 2. 北京自动测试技术研究所,北京,100088 3. 北京工业大学电子信息与控制工程学院,北京,100124 |
| 基金项目： | 北京市留学人员专项资金资助 |
| 摘 要： | 本文采用复杂可编程逻辑器件（CPLD）和分立器件,设计实现了IEEE 1149.4混合信号边界扫描标准实验测试结构。为了提高互连测试的故障诊断能力,文中对模拟边界模块（ABM）开关结构进行了一些修改。针对ABM单元的这些修改允许测试者可以将模拟输入信号与多个电压进行比较。当测试者在简单互连或扩展互连中遇到桥接故障,扩展的ABM开关结构使得故障更容易探测。 |
| 关 键 词： | IEEE 1149.4标准 混合信号 边界扫描 电路测试 |
Designing and extending IEEE Std. 1149.4 experimental test infrastructure to enhance fault diagnosis |
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| Liu Linsheng,Zhang Dong,Chen Jianxin. Designing and extending IEEE Std. 1149.4 experimental test infrastructure to enhance fault diagnosis[J]. Electronic Test, 2012, 0(5): 1-6 | |
| Authors: | Liu Linsheng Zhang Dong Chen Jianxin |
| Affiliation: | 1 Beijing Institute of Auto-Testing Technology,Beijing 100088; 2 College of Electronic Information and Control Engineering,Beijing University of Technology,Beijing 100124) |
| Abstract: | By using a CPLD(Complex Programmable Logic Device ) and discrete devices,the design of the IEEE 1149.4 mixed-signal boundary scan standard experimental test infrastructure was implemented in this paper.In order to augment the diagnostic capability of interconnect test,some modifications have been applied to the ABM switching architecture.These modifications to the ABM cells that allow testers to compare analog input signals with multiple voltage levels.When the testers encounter a brigding fault in a simple interconnect or an extended interconnect,the extended ABM switching architecture makes it easily detectable. |
| Keywords: | IEEE Std. 1149.4 mixed-signal boundary scan circuit test |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ | |