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基于单片机AT89C52的漏磁检测实验系统开发
引用本文:郭众宝,孙远翔,唐永刚.基于单片机AT89C52的漏磁检测实验系统开发[J].机电产品开发与创新,2005,18(1):98-100.
作者姓名:郭众宝  孙远翔  唐永刚
作者单位:北京理工大学,机电工程学院,北京,100813
摘    要:本文介绍了基于单片机技术的漏磁检测系统。首先介绍了漏磁检测的原理,然后结合电子电路技术,单片机技术,开发了一套漏磁检测实验系统。该系统包括信号的采集,预处理,模/数转换,数据结果存储,数据串口发送。单片机的软件系统采用模块化设计,分为数据采集、数据存储、数据串口发送模块等。

关 键 词:漏磁检测  AT89C52  铁电存储器  FM1808
文章编号:1002-6673(2005)01-098-03

Test System of Magnetic Flux Leakage Base on AT89C52
GUO Zhong-Bao,SUN Yuan-Xiang,TANG Yong-Gang.Test System of Magnetic Flux Leakage Base on AT89C52[J].Development & Innovation of Machinery & Electrical Products,2005,18(1):98-100.
Authors:GUO Zhong-Bao  SUN Yuan-Xiang  TANG Yong-Gang
Abstract:A test of test system of Magnetic Fux Leakage bse on AT89C52 is proposed. Firstly, the theory of Magnetic Fux Leakage is introduced. A test of test system of Magnetic Fux Leakage is used of the electron and circuit theory and the technology of MCU.Data Acquiring, data processing,A/D,data preserving, and data sending by RS-232 is included in the test system. The software of MCU is base on modularization, including the modules of A/D, the modules of data preserving, and the modules of data sending by RS-232.
Keywords:Magnetic Flux Leakage  AT89C52  FRAM  FM1808
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