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高压二极管的反向恢复时间测试系统
引用本文:陈亚军,陈隆道.高压二极管的反向恢复时间测试系统[J].电子器件,2012,35(1):61-64.
作者姓名:陈亚军  陈隆道
作者单位:浙江大学电气工程学院
摘    要:通过对二极管的反向恢复过程及相关应用的研究,指出二极管反向恢复时间测试的必要性,综合比较了三种现有的反向恢复时间的测试方法的优缺点,提出并设计了一个测量范围更广、更实用、精度更高、成本也较低的高压二极管反向恢复时间测试系统。该文对设计方案进行了误差分析,根据仪器在工厂的运行情况及示波器结果显示的比较,证明方案可行且误差较小。

关 键 词:高压二极管  反向恢复时间  差分放大  测试系统

The Test System of High-voltage Diode Reverse Recovery Time
CHEN Yajun,CHEN Longdao.The Test System of High-voltage Diode Reverse Recovery Time[J].Journal of Electron Devices,2012,35(1):61-64.
Authors:CHEN Yajun  CHEN Longdao
Affiliation:(College of Electrical Engineering Zhejiang University,Hangzhou 310027,China)
Abstract:Through research of the diode reverse recovery process and related application,the diode reverse recovery time test was necessary.Compared comprehensively of advantages and disadvantages of three kinds of existing reverse recovery time test methods,this paper proposed and designed a wider measure range,more practical,higher precision,lower cost reverse recovery time test system of high voltage diode.The error is analyzed.According to the comparison of equipment in the system operation and the measured result,it proved that the program is feasible and with smaller error.
Keywords:high-voltage diodes  reverse recovery time  differential amplifier  test system
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