Response analysis for identifying the origin of photo-modulated current contrasts in scanning tunneling microscopic imaging semiconductor surfaces |
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| Authors: | Naruse Nobuyasu Mera Yutaka Hayashida Yukinobu Maeda Koji |
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| Affiliation: | Department of Applied Physics, School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan. naruse@exp.t.u-tokyo.ac.jp |
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| Abstract: | Inhomogeneities in semiconductor solids can be imaged by two-dimensional mapping of the amplitude of periodically modulated tip current in scanning tunneling microscopy that is induced by illumination of semiconductor samples with a chopped light. It has been shown that it is possible to distinguish between plural origins of the photo-modulated current by analyzing the response properties of the current signal. A judicial choice of the modulation frequency is important for the required contrasts to be obtained. |
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| Keywords: | 61 16 Ch 72 40 +w 73 30 +y 78 66 ?w |
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