Automatic generation and compaction of March tests for memoryarrays |
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Authors: | Zarrineh K Upadhyaya SJ Chakravarty S |
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Affiliation: | Sun Microelectron., Chelmsford, MA; |
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Abstract: | Given a set of memory array faults, the problem of computing a compact March test that detects all specified memory array faults is addressed. In this paper, we propose a novel approach in which every memory array fault is modeled by a set of primitive memory faults. A primitive March test is defined for each primitive memory fault. We show that March tests that detect the specified memory array faults are composed of primitive March tests. A method to compact the March tests for the specified memory array faults is described. A set of examples to illustrate the approach is presented. Experimental results demonstrate the productivity gained using the proposed framework |
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