| 倍频移相扫描法电光采样测量 |
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| 引用本文： | 田小建 马振昌. 倍频移相扫描法电光采样测量[J]. 红外与毫米波学报, 1997, 16(3): 189-192 |
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| 作者姓名： | 田小建 马振昌 |
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| 作者单位： | 集成光电子学国家重点联合实验室吉林大学实验区，电子工业部第１３研究所 |
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| 摘 要： | 分析了倍频移相扫描法的工作原理，介绍了用倍频移相扫描法构成的电光采样测量系统．测量了高速ＧａＡｓ动态分频器集成电路芯片，并给出分频关系波形的测量结果．
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| 关 键 词： | 移相扫描，电光采样，集成电路芯片 |
THE ELECTRO OPTIC SAMPLING MEASUREMENT WITH MULTIPLE FREQUENCY PHASE SHIFT SCANNING METHOD |
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| Tian Xiaojian Yi Maobin Sun Wei Jia Gang Sun Jianguo. THE ELECTRO OPTIC SAMPLING MEASUREMENT WITH MULTIPLE FREQUENCY PHASE SHIFT SCANNING METHOD[J]. Journal of Infrared and Millimeter Waves, 1997, 16(3): 189-192 |
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| Authors: | Tian Xiaojian Yi Maobin Sun Wei Jia Gang Sun Jianguo |
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| Abstract: | The principle of multiple frequency phase shift scanning method was analyzed. The electro optic sampling system constructed with the multiple frequency phase shift scanning method was introduced. An integrated circuit chip of high speed GaAs dynamic freqnency dividing circuit was measured, and the measured frequency dividing waveform was presented. |
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| Keywords: | phase shift scanning electro optic sampling integrated circuit chip. |
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