Interfacial capacitance in epitaxial heterostructures La0.67Ca0.33MnO3/SrTiO3/La0.67Ca0.33MnO |
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Authors: | Yu. A. Boikov V. A. Danilov |
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Affiliation: | (1) Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. Petersburg, 194021, Russia |
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Abstract: | Epitaxial trilayer heterostructures of the type La0.67Ca0.33MnO3/SrTiO3/La0.67Ca0.33MnO3 were grown by laser ablation on (001)[(LaAlO3)0.3+(Sr2AlTaO6)0.7] substrates. The real part of the dielectric permittivity ε and the loss factor tan δ of a 1100-nm-thick SrTiO3 interlayer were studied in the temperature interval T=4.2–300 K in a nonbiased state and at a bias voltage of ±2.5 V applied to the manganite electrodes. Using the temperature dependence ε(T) measured for the SrTiO3 layer grown between the manganite electrodes, we have estimated the capacitance of La0.67Ca0.33MnO3/SrTiO3 interfaces (C1≈2 μF/cm2) related to the electric field penetrating from the interlayer into La0.67Ca0.33MnO3. |
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