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简装防空导弹贮存可靠性研究
引用本文:张丰君,崔少辉,李岩,彭荣木. 简装防空导弹贮存可靠性研究[J]. 兵工自动化, 2008, 27(5): 40-42
作者姓名:张丰君  崔少辉  李岩  彭荣木
作者单位:军械工程学院,导弹工程系,河北,石家庄,050003
摘    要:对某型筒装导弹的贮存薄弱环节进行分析,并建立影响导弹贮存可靠性的故障树。利用现有的加速寿命试验模型对导弹关键部件进行加速寿命试验,其基本任务就是通过试验对模型参数进行辨识,加速模型包括:Arrhenius模型、逆幂律(Inverse Power Law,IPL)模型、单应力Eyring模型,以及广义Eyring模型。

关 键 词:筒装导弹  故障树  加速寿命试验  贮存可靠性模型
文章编号:1006-1576(2008)05-0040-02
修稿时间:2008-01-12

Research on Storage Reliability of Barreled Air Defense Missile
ZHANG Feng-jun,CUI Shao-hui,LI Yan,PENG Rong-mu. Research on Storage Reliability of Barreled Air Defense Missile[J]. Ordnance Industry Automation, 2008, 27(5): 40-42
Authors:ZHANG Feng-jun  CUI Shao-hui  LI Yan  PENG Rong-mu
Affiliation:(Dept. of Missile Engineering, Ordnance Engineering College, Shijiazhuang 050003, China)
Abstract:At first,build the fault tree that affect the storage reliability of missile by analyzing the weak link in storage of barreled missile.Then,use accelerated life testing model to test the key missile parts.Its basic task is discriminate the model parameters by testing.Accelerated model includes Arrhenius model,IPLmodel,single stress Eyring model,and generalized Eyring model.
Keywords:Barreled missile  Fault tree  Accelerated life testing  Storage reliability model
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