Optical grating diffraction method: from strain microscope to strain gauge

The grating diffraction method for direct strain measurement is reviewed. Two systems which use this method are presented. The first system is a compact strain microscope. A Leitz optical transmitting microscope with white light source is reconstructed by developing a loading and recording system. Gratings with median density of between 40 and 200 lines/mm are used. With the help of a Bertrand lens, the Fourier spectrum of the grating is formed with high image quality on the CCD sensor plane. Software is developed to precisely, quickly and automatically determine the diffraction spot centroids. The second system is a new strain sensor based on a high-frequency grating and two Position Sensor Detectors (PSDs). The grating, attached to the surface of the specimen, is illuminated by a focused laser beam, generally with a frequency of 1,200 lines/mm. The centroids of diffracted beam spots from the grating are automatically determined using two PSD sensors connected to a personal computer. The shift of diffracted beam spots due to specimen deformation is detected. Strain sensitivity of one micro-strain can be obtained, as can a 0.4 mm spatial resolution for strain measurement. The system can be used for both static and dynamic tests.