Thin oxide thickness extrapolation from capacitance-voltagemeasurements |
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Authors: | Walstra SV Chih-Tang Sah |
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Affiliation: | Solid-State Electron. Lab., Florida Univ., Gainesville, FL; |
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Abstract: | Five oxide-thickness extrapolation algorithms, all based on the same model (metal gate, negligible interface traps, no quantum effects), are compared to determine their accuracy. Three sets of parameters are used: (acceptor impurity concentration, oxide thickness, and temperature): (1016 cm-3, 250 Å, 300 K), (5×1017 Cm-3, 250 Å, 300 K), and (5×1017 cm-3, 50 Å, 150 K). Demonstration examples show that a new extrapolation method, which includes Fermi-Dirac statistics, gives the most accurate results, while the widely-used Co≃Cg (measured at the power supply voltage) is the least accurate. The effect of polycrystalline silicon gate is also illustrated |
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