Electrical characterization and modeling of alternating-currentthin-film electroluminescent devices |
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| Authors: | Davidson J.D. Wager J.F. Khormaei R.I. King C.N. Williams R. |
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| Affiliation: | Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR; |
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| Abstract: | Electrical characterization of evaporated ZnS:Mn alternating-current thin-film electroluminescent (ACTFEL) devices is accomplished by capacitance-voltage (C-V) analysis. Interpretation of these C-V characteristics is aided by SPICE modeling and by electrical characterization of an ideal ACTFEL device constructed from discrete components, based on a simple equivalent circuit for the ACTFEL device. Various features of the C -V curve are ascribed to equivalent circuit parameters and associated device physics parameters |
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