| 导致MLCC失效的常见微观机理 |
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| 引用本文： | 李世岚,包生祥,彭晶,马丽丽.导致MLCC失效的常见微观机理[J].电子元件与材料,2007,26(5):58-61. |
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| 作者姓名： | 李世岚 包生祥 彭晶 马丽丽 |
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| 作者单位： | 电子科技大学电子薄膜与集成器件国家重点实验室,四川,成都,610054 |
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| 摘 要： | 多层陶瓷电容器(MLCC)在实际使用过程中,电参数会发生不同程度的偏离,降低了可靠性,直到MLCC失效。其失效原因可分为外部因素和内在因素,分析讨论了影响MLCC可靠性的内在因素——MLCC内部分层、导电粒子、金属离子迁移和介电老化等常见微观失效机理,并提出了主要应对措施。
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| 关 键 词： | 电子技术 MLCC 失效分析 内在因素 微观机理 |
| 文章编号： | 1001-2028（2007）05-0058-04 |
| 修稿时间： | 2006-12-28 |
Microcosmic mechanism of causing failure of MLCC |
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| LI Shi-lan,BAO Sheng-xiang,PENG Jing,MA Li-li.Microcosmic mechanism of causing failure of MLCC[J].Electronic Components & Materials,2007,26(5):58-61. |
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| Authors: | LI Shi-lan BAO Sheng-xiang PENG Jing MA Li-li |
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| Affiliation: | State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology, Chengdu 610054, China |
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| Abstract: | In practical application of MLCC,its electric parameter will change and reliability will degrade until it fails.Failed reasons of MLCC can be divided into two kinds: internal and external.The former are inner layer,migration of conduct particle and metal ions,dielectric ageing and so on.And main overcoming ways are discussed. |
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| Keywords: | electron technology MLCC failure analysis internal factors microcosmic mechanism |
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