时序电路的模糊化测试生成算法

文章提出的模糊化的时序电路测试生成算法不明确指定故障点的故障值，它将故障值模糊化，并以符号表示。本算法第一阶段通过计算状态线和原始输出端的故障值来寻找测试矢量，通过计算故障点的正常值来 寻找测试矢量对应的故障类型；第二阶段用故障点的正常值作为约束条件计算故障点的另一个测试矢量。与传统的算法不同，它不需要回退和传播的过程。实验结果表明本算法具有较高的故障覆盖率和较少的测试时间。

The Fuzzy Test Generation Algorithm for Sequential Circuits

This paper mainly proposes a fuzzy test generation algorithm for sequential circuits. In our method, the fault value is represented fuzzily as symbolic value, and several key techniques are used to generate test vectors to achieve high fault coverage at low computational complexity. This new algorithm combined with two phases. The first phase it generate the test vector by computing the fault value of the state line,and find the fault value of the fault point by computing it's normal value using the first input value of the test sequence. In the second phase, use the normal value of the fault point as constraint condition generating another test vector of the fault point. This method is radically different from the conventional methods,and it doesn't need the process of propagation and backtracks. Some experimental results on the benchmark circuits demonstrate the feasibility of this algorithm.