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Co/Pt多层膜X射线小角衍射分析
引用本文:陈亮维,吴隽,王永能. Co/Pt多层膜X射线小角衍射分析[J]. 贵金属, 1998, 0(4)
作者姓名:陈亮维  吴隽  王永能
作者单位:中国昆明贵金属研究所
基金项目:云南省应用基础研究基金,中国有色金属工业总公司高技术项目
摘    要:对Co/Pt多层膜进行X射线小角衍射分析,测量出多层膜的周期厚度,解释多层膜小角衍射主峰之间出现次峰的现象,并确立了次峰个数与膜周期数之间的关系。

关 键 词:Co/Pt多层膜,X射线衍射

Small-Angle X-ray Diffraction Analysis of Co/Pt Multilayer Films
Chen Liangwei,Wu Jun,Wang Yongneng. Small-Angle X-ray Diffraction Analysis of Co/Pt Multilayer Films[J]. Precious Metals, 1998, 0(4)
Authors:Chen Liangwei  Wu Jun  Wang Yongneng
Abstract:Small-angle X-ray diffraction has been used to study the microstructure of Co/Pt multilayer film.The period thickness has been deduced from the Bragg equation with refraction correction.The phenomenon of secondary peaks appearing among primary peaks has been explained.The function relation between the secondary peak number and the period number in multilayer film has been established.
Keywords:Co/Pt Multilayer film  X-ray diffraction  
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