| 硅雪崩光电二极管的计算机自动测试 |
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| 引用本文： | 陈启玙,陈瑞璋,陈莲勇,王德宁,何梁昌.硅雪崩光电二极管的计算机自动测试[J].自动化学报,1983,9(2):106-112. |
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| 作者姓名： | 陈启玙 陈瑞璋 陈莲勇 王德宁 何梁昌 |
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| 作者单位： | 1.中国科学院上海冶金研究所 |
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| 摘 要： | 本文根据硅雪崩光电二极管(Si-APD)的测试原理,设计了一套计算机测试系统,包括光
源部分、直流偏置扫描电源、二进制权电阻器、XF-01选频放大器、A/D,D/A接口转换器和
JS-10小型计算机.文中对设计的合理性、使用的可靠性及测试误差进行了分析和讨论.实
践证明,该测试系统能满足计算机自动测试Si-APD直流或低频参数的要求.
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| 收稿时间： | 1981-10-05 |
Automatic Testing for Si-Apd With A Computer |
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| Chen Qiyu,Chen Ruizhang,Chen Lianyong,Wang Dening,He Liangchang.Automatic Testing for Si-Apd With A Computer[J].Acta Automatica Sinica,1983,9(2):106-112. |
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| Authors: | Chen Qiyu Chen Ruizhang Chen Lianyong Wang Dening He Liangchang |
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| Affiliation: | 1.Shanghai Institute of Metallurgy,Chinese Academy of Sciences |
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| Abstract: | In this paper, based on the principles of the measurement of parameters of silicon
avalanche photo diodes, the design of a practical testinging system is presented. The
system includes light source, d-c scanning bias power supply, the binary-weighted
resistors, XF-O1 frequencyseleetive amplifier, A/D and D/A converters, and a
minicomputer. Rationality of the design, reliability of the system in operation, and the
accuracy of measurement are discussed. It has been proved that the requirements of the
automatic measurement of Si-APD d-c parameters with a computer are well satisfied. |
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| Keywords: | NULL |
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