| 建立在模拟集成电路上的边界扫描设计 |
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| 引用本文： | 冯长江,李晓峰,毛博.建立在模拟集成电路上的边界扫描设计[J].计算机测量与控制,2011,19(11). |
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| 作者姓名： | 冯长江 李晓峰 毛博 |
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| 作者单位： | 军械工程学院,河北石家庄,050003 |
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| 摘 要： | 对模拟芯片边界扫描测试方法进行了研究,结合IEEE1149.1标准框架结构和IEEE1149.4标准混合信号测试总线思想构建了模拟芯片边界扫描测试电路,运用了数字移位寄存器和模拟开关构成模拟边界扫描单元,并编写了TAP控制器及其它电路的VHDL代码,通过实验仿真验证了测试电路的可行性。测试电路可以完成模拟芯片的简单互连测试以及性能测试。
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| 关 键 词： | 模拟芯片 边界扫描 TAP控制器 性能测试 |
Design of Boundary Scan Circuit for Analog Integrated Chip |
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| Feng Changjiang,Li Xiaofeng,Mao Bo.Design of Boundary Scan Circuit for Analog Integrated Chip[J].Computer Measurement & Control,2011,19(11). |
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| Authors: | Feng Changjiang Li Xiaofeng Mao Bo |
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| Affiliation: | Feng Changjiang,Li Xiaofeng,Mao Bo(Ordance Engineering College,Shijiazhuang 050003,China) |
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| Abstract: | A study was made on the method of boundary scan test for analog integrated chip,and the circuit of boundary scan test for analog integrated chip was built based on the structure from IEEE1149.1 and the idea of mixed signal test bus from IEEE1149.4.The analog boundary module was formed with digital shift registers and analog switches.The code of TAP controller and other circuit were written with VHDL and the result of simulation shows that the test cycle can work as expected.With the test circuit,simple inte... |
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| Keywords: | analog integrated chip boundary scan tap controller functional test |
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