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| 基于机器视觉的高密度电路板缺陷检测系统 | |
| 引用本文： | 熊光洁,马树元,聂学俊,武思远,汤晓华.基于机器视觉的高密度电路板缺陷检测系统[J].计算机测量与控制,2011,19(8). |
| 作者姓名： | 熊光洁 马树元 聂学俊 武思远 汤晓华 |
| 作者单位： | 1. 北京工商大学机械工程学院,北京100048;北京理工大学机械与车辆工程学院,北京100081 2. 北京理工大学机械与车辆工程学院,北京,100081 3. 北京星河泰视特科技有限公司,北京,100094 4. 北京工商大学机械工程学院,北京,100048 |
| 基金项目： | 北京市科委创新项目(K20090217L) |
| 摘 要： | 为减少高密度电路板的缺陷误报率,研究一种新型自动光学检测系统(AOI);系统采用自行研制的多色LED照明系统,利用机器视觉获取被测PCB的图像,通过图像处理软件系统快速准确地识别出各种缺陷;系统利用获取的彩色图像信息,根据各种缺陷的特征信息不同,采用OPENCV对各种缺陷的检测算法进行改进,使得系统性能有很大改进;对30块同类HDI型PCB的36300个检测点进行测试,测试结果证明,系统PCB缺陷的检出率高达99.87%,误报率只有0.32%。 |
| 关 键 词： | 机器视觉 高密度电路板 多色LED照明 缺陷检测 OPENCV |
Defects Inspection System of HID PCB Based on Machine Vision |
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| Xiong Guangjie,Ma Shuyuan,Nie Xuejun,Wu Siyuan,Tang Xiaohua.Defects Inspection System of HID PCB Based on Machine Vision[J].Computer Measurement & Control,2011,19(8). | |
| Authors: | Xiong Guangjie Ma Shuyuan Nie Xuejun Wu Siyuan Tang Xiaohua |
| Affiliation: | Xiong Guangjie1,2,Ma Shuyuan2,Nie Xuejun1,Wu Siyuan3,Tang Xiaohua1(1.College of Mechanical Engineering,Beijing Technology and Business University,Beijing 100048,China,2.School of Mechanical and Vehicle Engineering,Beijing Institute of Technology,Beijing 100081,3.Beijing Star River Test Science and Technology Company,Ltd,Beijing 100094,China) |
| Abstract: | An improved automated optical inspection system(AOI) is researched to decrease defects false alarm rate of HDI PCB.With a new multicolor LED illuminator,the system can capture the tested PCB image by using machine vision,and identify the various defects quickly and accurately through image processing software systems in this paper.The performance system of this AOI has been greatly improved by using improved hardware system and algorithms which was programmed on OPENCV platform by using the colorful informa... |
| Keywords: | machine vision HDI PCB multicolor illuminator defects inspection OPENCV |
| 本文献已被 CNKI 万方数据 等数据库收录！ | |