| 电感耦合等离子体发射光谱法测定铟中杂质元素 |
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| 引用本文： | 刘传仕. 电感耦合等离子体发射光谱法测定铟中杂质元素[J]. 矿冶, 2005, 14(2): 86-89 |
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| 作者姓名： | 刘传仕 |
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| 作者单位： | 株冶火炬金属股份有限公司,湖南株洲,412004 |
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| 摘 要： | 利用全谱直读ICP-OES分析技术,通过对元素分析谱线选择和背景校正扣除、仪器分析参数等进行试验优化,综合确定了最佳分析条件,并采用基体匹配消除基体影响,在电感耦合等离子体发射光谱仪上直接测定铟中铝、砷、镉、铜、铁、铅、锡、铊等杂质元素。方法的回收率在94%~110%,各元素的检出限不大于1.2μg/50mL。
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| 关 键 词： | ICP-OES 铟 杂质 测定 |
| 文章编号： | 1005-7854(2005)02-0086-04 |
| 修稿时间： | 2005-01-05 |
DETERMINATION OF IMPURITY ELEMENTS IN INDIUM BY ICP-OES |
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| LIU Chuan-shi. DETERMINATION OF IMPURITY ELEMENTS IN INDIUM BY ICP-OES[J]. Mining & Metallurgy, 2005, 14(2): 86-89 |
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| Authors: | LIU Chuan-shi |
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| Abstract: | In this paper, with the use of ICP-OES analysis technique, the optimum analysis conditions were worked out by optimizing element analysis spectrum, deduction of background correction and instrument analysis parameters. The optimized conditions accompanying the use of matrix's match in elimination of the influence of the matrix made directly the measurement of some impurity elements in indium by ICP-OES. The detection limit of each element was less than 1.2g/50mL. The recoveries were found in the range of 94%110%. |
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| Keywords: | ICP-OES Indium Impurity Determination |
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