可寻址测试芯片测试结构自动分配算法研究

为了缓解由于可寻址测试芯片自动化设计方法的缺失所带来的设计效率低下、设计稳定性不足等问题，针对可寻址测试芯片设计过程中的测试结构分配环节，将线性规划应用到测试结构的自动分配算法中。通过整理现有的手动分配测试结构的方法，得到了一套测试结构分配的基本规则；同时，将这些分配规则转换为多元一次不等式的数学表述，从而构建了针对测试结构分配环节、基于线性规划的数学模型，根据该数学模型，可以发展出一个自动分配器以快速、自动地解决可寻址测试芯片的测试结构分配问题。研究结果表明，基于线性规划的自动分配器可以在数分钟内完成上千个测试结构的自动分配；同时，自动分配器会在考虑各种测试结构分配的基本规则的前提下，在测试单元空间利用率上得到一个最优化组合方案。

Research of placement of test structure in addressable test chip

In order to relieve the disadvantage in efficiency and reliability caused by lack of automatic way in addressable test chip design, aiming to the placement of the test structure, the linear programming was investigated. After researching the manual way in placement of test structure, a set of rules was summarized and expressed as multivariate inequality, and the mathematical model based on linear programming was established and developed into an automatic placer which will help the designer finish the placement of test structure quickly and auto- matically. The experimental result indicates that the automatic placer can address placement of thousands of test structure in minutes, and so- lution is optimized in area efficiency.