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High-temperature X-ray structural,thermal and dielectric characteristics of ferroelectric Bi2VO5.5
Authors:K. V. R. Prasad  K. B. R. Varma
Affiliation:(1) Materials Research Centre, Indian Institute of Science, 560 012 Bangalore, India
Abstract:The X-ray powder diffraction, dielectric and thermal studies of bismuth vanadate (Bi2VO5.5) ceramic have been carried out as a function of temperature (300–900 K). The hightemperature X-ray studies, supported by differential scanning calorimetry, clearly demonstrate that Bi2VO5.5 undergoes two major phase transitions at sim730 and sim835 K. It was found that the one at 730 K is associated with both the ferroelectric and the crystallographic transition, while at 835 K, Bi2VO5.5 undergoes only the crystallographic transition. Anomalies in both the dielectric constant and specific heat curves have been observed at sim 730 and sim 835 K. The total heat, DeltaQ, and entropy, DeltaS, associated with the transition at 730 K were found to be higher than those at 835 K.
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