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Influence of lithium doping on the structural and electrical characteristics of ZnO thin films
Authors:T Anto JohnyViswanathan Kumar  Hideyuki ImaiIsaku Kanno
Affiliation:
  • a Centre for Materials for Electronics Technology (C-MET), (Department of Information Technology, Scientific Society, Ministry of Communication and Information Technology, Govt. of India), Athani (PO), Thrissur, 680 581 Kerala, India
  • b Micro Engineering, Kyoto University, Kyoto 606-8501, Japan
  • Abstract:Thin films of undoped and lithium-doped Zinc oxide, (Zn1 − xLix)O; x = 0, 0.05, 0.10 and 0.20 were prepared by sol-gel method using spin-coating technique on silicon substrates (111)Pt/Ti/SiO2/Si)]. The influence of lithium doping on the structural, electrical and microstructural characteristics have been investigated by means of X-ray diffraction, leakage current, piezoelectric measurements and scanning electron microscopy. The resistivity of the ZnO film is found to increase markedly with low levels (x ≤ 0.05) of lithium doping thereby enhancing their piezoelectric applications. The transverse piezoelectric coefficient, e31? has been determined for the thin films having the composition (Zn0.95Li0.05)O, to study their suitability for piezoelectric applications.
    Keywords:Piezoelectric properties  Thin films  Zinc oxide
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