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Scanning Tunneling Microscopy in (Bi,Sb)2(Te,Se, S)3 Chalcogenide Thermoelectrics |
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| Authors: | Lukyanova L. N. Makarenko I. V. Usov O. A. |
| Affiliation: | 1.Ioffe Institute, 194021, St. Petersburg, Russia ; |
| Abstract: | Semiconductors - The morphology of the (0001) interlayer surface has been investigated by scanning tunneling microscopy in n-Bi1.6Sb0.4Te2.94Se0.06, n-Bi1.8Sb0.2Te2.82Se0.09S0.09,... |
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