Testing second-order delta-sigma modulators using pseudo-random patterns |
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Authors: | C.K Ong J.L HuangK.T Cheng |
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Affiliation: | Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA 93106, USA |
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Abstract: | Single-bit second-order delta-sigma modulators are commonly used in high-resolution analog-to-digital converters (ADCs). This type of modulator requires high-resolution test stimulus, which is difficult to generate. This paper proposes a novel and robust technique to determine the performance of the modulator by characterizing its key parameters using a pseudo-random pattern sequence. This technique is suitable for BIST application since a pseudo-random sequence can be generated on-chip using LFSR. Numerical simulation results show that this technique is capable of identifying parameters that affect the performance of a second-order delta-sigma modulator ADC. |
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Keywords: | Delta-sigma modulation Analog-to-digital converter testing Pseudo-random sequence Structural testing |
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