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几何校正在微光瞄准仪检测系统中的应用
引用本文:高有堂,常本康,田思,邱亚峰. 几何校正在微光瞄准仪检测系统中的应用[J]. 微计算机信息, 2007, 23(19): 156-158
作者姓名:高有堂  常本康  田思  邱亚峰
作者单位:1. 210094,江苏南京,南京理工大学电子工程与光电技术学院;473004,河南南阳,南阳理工学院电子与电气工程系
2. 210094,江苏南京,南京理工大学电子工程与光电技术学院
基金项目:总装备部某军品研究所科技攻关项目;河南省教育厅自然科学基金
摘    要:多环境试验条件下微光瞄准镜检测技术一直是军备生产所关注的问题.由于振动、射击、冲击、跌落和高低温环境等载荷作用下,使微光瞄准镜机械、光学结构和电性能参数发生改变,导致微光瞄准镜不能正常工作和使用.设计了多环境试验条件下的微光瞄准镜检测与测试系统,给出了由CCD组成检测系统工作原理.对微光瞄准镜图像几何畸变进行分析,提出了几何变换与校正算法,确定其精确数值.结合实际工程应用,其测量精度≤0.05密位,测量范围≥40密位,达到项目要求.

关 键 词:几何畸变  变换与校正  微光瞄准  检测
文章编号:1008-0570(2007)07-1-0156-03
修稿时间:2007-05-132007-06-15

Application of Geometry correction in Low-level-light Sight Instrument Measurement System
GAO YOUTANG,CHANG BENKANG,TIAN SI,QIU YAFENG. Application of Geometry correction in Low-level-light Sight Instrument Measurement System[J]. Control & Automation, 2007, 23(19): 156-158
Authors:GAO YOUTANG  CHANG BENKANG  TIAN SI  QIU YAFENG
Affiliation:GAO YOUTANG CHANG BENKANG TIAN SI QIU YAFENG
Abstract:Low- level- light (LLL) sight instrument measurement technologies based on multiple environments testing conditions are al- ways concerned by military equipments manufacturers. Because vibration, shooting, shock, drop and high low- temperature environ- ment, etc. are under loaded function , the machinery , optics structure and electric performance parameter change to make LLL sight instrument, causing the LLL sight instrument can' t be worked and used normally while taking aim. We have designed the measure and test system of LLL sight insyrment under multiple environmental experimental condition, provided and made up the operation principle of the detection system by CCD. Have analyzed the LLL sight instrument geometry distortion image, have brought forward algorithm of geometry transformation and correction, have already confirmed its accurate number value. Have combined actual project application, the measure precision which is less than 0.05 mil. and the measure range which is greater than 40 mil. can meet the project requirements.
Keywords:Geometry distortion  Transformation and correction LLL sight instrument  Measurement
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