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T/R组件中芯片制造和使用的可靠性分析与控制
引用本文:梅文辉.T/R组件中芯片制造和使用的可靠性分析与控制[J].现代雷达,2011,33(4):71-75.
作者姓名:梅文辉
作者单位:南京电子技术研究所,南京,210039
摘    要:随着雷达技术的发展,采用多芯片组装T/R组件的有源相控阵雷达越来越引起人们的关注并获得广泛的应用。在多芯片组装的T/R组件中,芯片可靠性是组件可靠性的决定因素。文中在对T/R组件构成及可靠性影响因素分析的基础上,从芯片制造、转运和使用等方面对芯片可靠性的影响进行了分析,并给出了提高芯片使用可靠性的措施及建议。

关 键 词:T/R组件  芯片  可靠性  控制

Analysis and Control of the Reliability of Chips Fabrication and Application in the T/R Modules
MEI Wen-hui.Analysis and Control of the Reliability of Chips Fabrication and Application in the T/R Modules[J].Modern Radar,2011,33(4):71-75.
Authors:MEI Wen-hui
Affiliation:MEI Wen-hui(Nanjing Research Institute of Electronics and Technology,Nanjing 210039,China)
Abstract:With the development of radar technology,the active phased-array-radar using T/R modules based on multi-chip-assembly technology receives more and more attention and is used widely.In the T/R modules based on multi-chip-assembly technology,the reliability of the T/R module mainly depended on the reliability of the used chips.In this paper,based on the analysis of the normal compositions and reliability factors of a T/R module,the effects of chip fabrication,transferring and application on the reliability of...
Keywords:T/R module  chip  reliability  control  
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