| 基于51单片机的晶体管特性测试系统的设计 |
| |
| 引用本文： | 张银胜,单慧琳. 基于51单片机的晶体管特性测试系统的设计[J]. 电子测量技术, 2009, 0(1): 92-94 |
| |
| 作者姓名： | 张银胜 单慧琳 |
| |
| 作者单位： | 南京信息工程大学电子与信息工程学院,南京,210044 |
| |
| 摘 要： | 介绍一种基于AT89S52单片机的晶体管特性测试系统的设计原理。详细说明该系统的基本原理、硬件框架、主要电路以及软件框架。整个系统采用模块化设计，较精确的对晶体管交直流放大特性参数、输入／输出特性曲线和频率特性进行测量。本系统具有性能可靠、抗干扰能力强、功耗低、性价比高等优点。
|
| 关 键 词： | 晶体管 特性测试 数控频率源 A/D转换 |
Design of the transistor characteristic test system based on 51 MCU |
| |
| Zhang Yinsheng,Shan Huilin. Design of the transistor characteristic test system based on 51 MCU[J]. Electronic Measurement Technology, 2009, 0(1): 92-94 |
| |
| Authors: | Zhang Yinsheng Shan Huilin |
| |
| Affiliation: | College of Electronic & Information Engineering;Nanjing University of Information Science & Technology;Nanjing 210044 |
| |
| Abstract: | This paper introduces the design of the transistor characteristic test system based on MCU(AT89S52).The system described in detail the basic principles of the framework of hardware,software,as well as the main framework of the circuit.The design is used to accurately messure to the AC and DC enlargement factor,the input and output characteristic and frequency characteristics. |
| |
| Keywords: | transistor characteristic test numerical control frequency source A/D transformation |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
