Intergranular film thickness of self-reinforced silicon carbide ceramics |
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| Authors: | Heon-Jin Choi Young-Wook Kim |
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| Affiliation: | a Department of Materials Science and Engineering, Korea Institute of Science and Technology, P.O. Box 131, Cheongryang, Seoul 130-650, South Korea;b Department of Materials Science and Engineering, University of Seoul, Seoul 130-743, South Korea |
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| Abstract: | The intergranular film of self-reinforced SiC ceramics prepared by hot pressing and further annealing with SiO2–Y2O3 and SiO2–Al2O3 as sintering additives was observed by high-resolution transmission electron microscopy. The film thickness of SiC ceramics with SiO2–Y2O3 was 1.2 nm whereas that of ceramics with SiO2–Al2O3 was 0.8 nm. Based on the refined continuum model, an explanation on the variation of thickness with sintering additives is given. It seems that the behavior of intergranular glassy film of SiC ceramics is akin to that of Si3N4 ceramics. |
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| Keywords: | SiC Liquid phase sintering Electron microscopy Grain boundaries Interphase |
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