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热红外光谱仪系统的内部杂散辐射定标与测量技术
引用本文:彭俊,何琦,张营,王佰海,孙德新,刘银年.热红外光谱仪系统的内部杂散辐射定标与测量技术[J].红外与毫米波学报,2019,38(5):621-626.
作者姓名:彭俊  何琦  张营  王佰海  孙德新  刘银年
作者单位:中国科学院上海技术物理研究所中国科学院红外探测与成像技术重点实验室,上海200083;中国科学院大学,北京100049;中国科学院上海技术物理研究所中国科学院红外探测与成像技术重点实验室,上海,200083;中国科学院上海技术物理研究所启东光电遥感中心,江苏启东,226200;中国科学院上海技术物理研究所中国科学院红外探测与成像技术重点实验室,上海200083;中国科学院大学,北京100049;中国科学院上海技术物理研究所启东光电遥感中心,江苏启东226200
基金项目:国家重点研发计划资助 2016YFB0500400国家重点研发计划资助(2016YFB0500400)
摘    要:提出了一种热红外光谱仪系统内部杂散辐射的测量方法,该方法基于探测器和热红外光谱仪系统的辐射定标.通过分别单独标定探测器对黑体辐射能量的全谱段输出响应曲线和光谱仪系统对黑体辐射能量分光后单一光谱通道的输出响应曲线,从而定量得出光谱仪的内部杂散辐射灰度值及辐射通量值且能计算出不同积分时间和光机温度时内部杂散辐射的灰度值及辐射通量.采用该方法对现有光谱仪内部杂散辐射进行了实验测量,并进行了对比实验,结果表明,对比实验值与理论预测值误差偏离小于1%.该方法可操作性高,可用于测量热红外光谱仪内部杂散辐射在总输出DN值中的占比、预测光谱仪制冷对内部杂散辐射的影响、测量其他内部杂散辐射抑制手段的效果等.

关 键 词:热红外  光谱仪  辐射定标  内部杂散辐射
收稿时间:2019/1/11 0:00:00
修稿时间:2019/7/2 0:00:00

Calibration and measurement of internal stray radiation in thermal infrared spectrometer system
PENG Jun,HE Qi,ZHANG Ying,WANG Bai-Hai,SUN De-Xin and LIU Yin-Nian.Calibration and measurement of internal stray radiation in thermal infrared spectrometer system[J].Journal of Infrared and Millimeter Waves,2019,38(5):621-626.
Authors:PENG Jun  HE Qi  ZHANG Ying  WANG Bai-Hai  SUN De-Xin and LIU Yin-Nian
Affiliation:Key Laboratory of Infrared System Detection and Imaging Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;University of Chinese Academy of Sciences, Beijing, 100049, China,Key Laboratory of Infrared System Detection and Imaging Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;University of Chinese Academy of Sciences, Beijing, 100049, China,Key Laboratory of Infrared System Detection and Imaging Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China,Qidong Optoelectronic Remote Sensing Center, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Qidong 226200, China,Key Laboratory of Infrared System Detection and Imaging Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;University of Chinese Academy of Sciences, Beijing, 100049, China;Qidong Optoelectronic Remote Sensing Center, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Qidong 226200, China,Key Laboratory of Infrared System Detection and Imaging Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;University of Chinese Academy of Sciences, Beijing, 100049, China;Qidong Optoelectronic Remote Sensing Center, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Qidong 226200, China
Abstract:A method for measuring internal stray radiation in thermal infrared spectrometer system was proposed in this paper, which is based on radiometric calibration of a detector and a thermal infrared spectrometer. The output response curves of detector and the spectrometer system to blackbody radiation energy of a single spectral channel are calibrated separately. Therefore, the internal stray radiation gray value and radiation flux value of the spectrometer can be obtained and the gray value and radiation flux of the internal stray radiation at different integration times and temperatures in the system can also be calculated. The proposed method was used to measure the internal stray radiation of an existing spectrometer, and comparative experiments were carried out. Results show that the error between the experimental results and the theoretical predicted values is less than 1%. The proposed method has high maneuverability and can be used to measure the proportion of internal stray radiation in total output DN value of the system, predict the influence of refrigeration on internal stray radiation of spectrometer, and measure the inhibition effect of other internal stray radiation suppression methods.
Keywords:thermal infrared  spectrometer  radiometric calibration  internal stray radiation
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