Residual stress measurement of an EB-PVD Y2O3-ZrO2 thermal barrier coating by micro-Raman spectroscopy |
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Authors: | M Tanaka R Kitazawa T Tomimatsu YF Liu Y Kagawa |
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Affiliation: | aResearch Center for Advanced Science and Technology, The University of Tokyo, Tokyo 153-8904, Japan |
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Abstract: | Residual stress distribution in an EB-PVD 4 mol% Y2O3-ZrO2 thermal barrier coating (TBC) layer coated on a superalloy substrate has been measured by micro-Raman spectroscopy. Piezo-spectroscopic coefficient was independently calibrated on a freestanding TBC layer. The coefficient for uniaxial stress is Πuni = 5.43 cm− 1GPa− 1. The stress measurement through the TBC thickness shows compressive stress distribution from small to an almost large constant value. Such a distribution agrees with theoretical consideration since the small stress correctly reflects the free edge effect and the large constant stress is closely related to TBC bulk stresses. |
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Keywords: | Thermal barrier coating Stress measurement Y2O3-ZrO2 Raman spectroscopy Piezo-spectroscopic coefficient |
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