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Residual stress measurement of an EB-PVD Y2O3-ZrO2 thermal barrier coating by micro-Raman spectroscopy
Authors:M Tanaka  R Kitazawa  T Tomimatsu  YF Liu  Y Kagawa  
Affiliation:aResearch Center for Advanced Science and Technology, The University of Tokyo, Tokyo 153-8904, Japan
Abstract:Residual stress distribution in an EB-PVD 4 mol% Y2O3-ZrO2 thermal barrier coating (TBC) layer coated on a superalloy substrate has been measured by micro-Raman spectroscopy. Piezo-spectroscopic coefficient was independently calibrated on a freestanding TBC layer. The coefficient for uniaxial stress is Πuni = 5.43 cm− 1GPa− 1. The stress measurement through the TBC thickness shows compressive stress distribution from small to an almost large constant value. Such a distribution agrees with theoretical consideration since the small stress correctly reflects the free edge effect and the large constant stress is closely related to TBC bulk stresses.
Keywords:Thermal barrier coating  Stress measurement  Y2O3-ZrO2  Raman spectroscopy  Piezo-spectroscopic coefficient
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