一种模拟单粒子瞬态产生和测量方法

为了提高利用静态随机存取存储器(SRAM)型现场可编程门阵列(FPGA)评估集成电路单粒子瞬态(SET)的精度,在瞬态脉冲的产生方面以及瞬态脉冲在FPGA中的传播特性方面进行了研究。提出一种基于IDELAY2延迟元件的瞬态脉冲产生和测量方法,利用该方法可以连续产生和测量宽度增量为78ps的正脉冲(0-1-0)和负脉冲(1-0-1),同时在FPGA内部实现8种不同的门电路逻辑链,研究它们对瞬态脉冲宽度的影响。实验结果表明该瞬态脉冲产生和测量方法实现简单,可以在不改变电路布局布线的前提下,改变注入脉冲的宽度,且计算得到的理论脉冲宽度与实际测量的误差小于7%,同时8种不同的门电路逻辑链对瞬态脉冲宽度的影响和门类型以及脉冲类型有关,与初始输入瞬态脉冲宽度无关。

A Methodology for Pulse Generation and Measurement of Single Event Transient Emulation

In order to improve the accuracy of evaluating the single event transient (SET) of integrated circuits using static random access memory (SRAM) field programmable gate array (FPGA),.Research has been carried out in FPGA about the generation of transient pulses and the propagation characteristics of transient pulses. A method of transient pulse generation and measurement based on IDELAY2 delay element is proposed, which can continuously generate and measure positive pulses (0-1-0) and negative pulses (1-0-1) with a width increment of 78 ps. At the same time, 8 different logic circuits of gate circuits are implemented in the FPGA to study their influence on the transient pulse width. The experimental results show that the transient pulse generation and measurement method is simple to implement, the width of the injected pulse can be changed without changing the circuit layout, and the error between the calculated theoretical pulse width and the actual measurement is less than 7%. At the same time, the effect of 8 different gate logic chains on the transient pulse width is related to the gate type and pulse type, and has nothing to do with the initial input transient pulse width.