基于IMU阵列的标定方法

微电子机械系统(MEMS)技术的发展使惯性传感器行业发生了革命性的变化，这使得生产惯性传感器阵列成为可能。然而，低成本的惯性测量系统会受到比例因子和轴失准误差的影响，从而造成位置和姿态估计的精度降低。在单个IMU校正的基础上，设计了一套基于IMU阵列的标定方法，该标定方法为了解决传统六面法在标定IMU阵列过程中方向激励不足的问题，设计了正20面的校正装置，该标定方法不仅能够估计出IMU阵列中单个IMU的比例因子、轴失准误差和偏置，还能估计出阵列中不同IMU之间的坐标轴对齐误差。通过把标定结果和官方所给的校正参数进行对比，可以得到经过本文所提的IMU阵列标定方法得到的标定结果能够达到工厂标定结果的百分之五十到百分之九十。

Calibration method based on IMU array

The development of microelectromechanical systems (MEMS) technology has revolutionized the inertial sensor industry, which has made it possible to produce inertial sensor arrays. However, low-cost inertial measurement systems are affected by scale factors and axis misalignment errors, which can lead to reduced accuracy of position and attitude estimation. Based on the calibration of a single IMU, a calibration algorithm based on the IMU array is designed in this paper. In order to solve the problem of insufficient directional excitation during the calibration of the IMU array using the traditional six-sided method, a calibration device with positive 20 sides is used. This calibration algorithm can not only estimate the scale factor, axis misalignment error and offset of a single IMU in the IMU array, but also estimate the coordinate axis alignment error between different IMUs in the array. By comparing the calibration results with the official calibration parameters, it can be obtained that the calibration results obtained by the IMU array calibration method proposed in this paper can reach 50% to 90% of the factory calibration results.