首页 | 本学科首页   官方微博 | 高级检索  
     


Polarization behavior of` lead-free 0.94(Bi0.5Na0.5)TiO3-0.06BaTiO3 thin films with enhanced ferroelectric properties
Affiliation:1. Materials Research Institute, The Pennsylvania State University, University Park, PA 16802, USA;2. Department of Physics and Astronomy, University of Nebraska, Lincoln, NE 68588, USA;3. Department of Materials Science and Engineering, University of Wisconsin-Madison, Wisconsin 53706, USA;1. Universite de Lyon, Ecole Centrale de Lyon, Institut des Nanotechnologies de Lyon, CNRS UMR5270, 36 avenue Guy de Collongue, 69134 Ecully Cedex, France;2. Synchrotron SOLEIL, AILES beamline, L''orme des merisiers, 91190 Saint Aubin, France;3. Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, Xi''an Jiaotong University, Xi''an 710049, China
Abstract:(Bi0.5Na0.5)TiO3 based ferroelectric lead-free thin films have great potential for modern micro-devices. However, the multicomponent feature and volatile nature of Bi/Na makes the achievement of high quality films challenging. In this work, the morphotropic phase boundary composition, 0.94(Bi0.5Na0.5)TiO3-0.06BaTiO3 thin films were successfully prepared by CSD method. Dense films with low dielectric loss and low leakage current density were obtained. A well-defined polarization hysteresis loop with a high remnant polarization was observed in the thin films. Moreover, the polarization behavior of the film at original state, under electric field and upon heating was investigated by PFM. A self-polarization and asymmetric domain switching behavior were observed. High temperature induced depolarization and the self-polarization recovered upon cooling. The thin films with good quality show a promising potential for the application in electrical devices, and the in-depth investigation of the polarization behavior improves the understanding of ferroelectric and piezoelectric properties of thin films.
Keywords:Lead-free  Thin film  Piezoresponse force microscopy  Chemical solution deposition  Polarization behavior
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号