| 利用红外热像仪测量材料的缺陷 |
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| 引用本文： | 陈珏. 利用红外热像仪测量材料的缺陷[J]. 激光与红外, 2000, 30(1): 39-41 |
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| 作者姓名： | 陈珏 |
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| 作者单位： | 东南大学电子工程系,南京,210096 |
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| 摘 要： | 介绍了利用红外热像仪检测材料内部缺陷的方法和实验结果。从传热学理论对有缺陷区域和无缺陷区域的温度进行了分析
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| 关 键 词： | 红外检测 热像仪 材料缺陷 |
Detecting Flaws in Material By Infrared Thermography |
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| CHEN Jue. Detecting Flaws in Material By Infrared Thermography[J]. Laser & Infrared, 2000, 30(1): 39-41 |
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| Authors: | CHEN Jue |
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| Abstract: | Detecting flaws in material by Infrared Thermography and experimental results are described.The surface temperature difference of flawed and flawless regions is analyzed in terms of heat conduction theory. |
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| Keywords: | Infrared testing Thermography flaws. |
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