Effect of substrate temperatures on the electrical resistivity of thermally evaporated Mn thin films |
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Authors: | F. Boakye E.K.K. Abavare |
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Affiliation: | Department of Physics, Kwame Nkrumah University of Science and Technology, Kumasi, Ghana |
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Abstract: | Resistivity measurements have been performed on three samples of Mn thin films from 300 to 1.4 K using the van der Pauw four probe technique. The films were grown by thermal evaporation onto glass substrates held at 523, 323 and 77 K, respectively in a bell jar held at 6 × 10−6 Torr. The resistivity-temperature results of the three specimens reveal a variety of low temperature behaviours. A behaviour typical of the bulk α-Mn is obtained with the film grown at a substrate temperature of 523 K whilst with the film grown at a substrate temperature of 323 K, the resistivity tends to a saturation at low temperatures exhibiting a behaviour reminiscent of Kondo scattering. The resistivity-temperature behaviour of the sample held at a substrate temperature of 77 K may be regarded as typical of a metallic alloy glass with a negative temperature coefficient of resistivity at high temperatures and this turns to a T2 dependence of resistivity at very low temperatures. |
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Keywords: | Manganese Resistivity Kondo scattering Metallic-alloy-glass |
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