|
|||||
|
|
Reliability of pure Mn and Mn/MgF2 cermet thin film resistors |
|
| Authors: | L. Olumekor J. Beynon |
| Affiliation: | Physics Department, Brunel University, Uxbridge, Middlesex Gt. Britain |
| Abstract: | |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ | |
|
||||||||||||||||||||
|
||||||||||||||||||||
|
||||||||||||||||||||
|
|
|
|
| 设为首页 | 免责声明 | 关于勤云 | 加入收藏 |
|
Copyright©北京勤云科技发展有限公司 京ICP备09084417号 |