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用MOCVD方法制备ZnO:B透明导电薄膜及其性能优化
引用本文:孟凡英,江民林,余跃波,胡宇. 用MOCVD方法制备ZnO:B透明导电薄膜及其性能优化[J]. 太阳能学报, 2008, 29(8)
作者姓名:孟凡英  江民林  余跃波  胡宇
作者单位:上海交通大学物理系太阳能研究所,上海,200240
摘    要:采用金属氧化物化学气相沉积(MOCVD)方法在石英衬底上生长氧化锌(ZnO)薄膜.改变薄膜材料的生长温度和掺杂气体硼烷(B2H6)的流速,制备一系列薄膜样品.通过x-射线衍射(XRD)、扫描电子显微镜(SEM)、透过率、反射率、电阻率和原子力显微镜(AFM)等测试分析,研究了材料生长温度和B2H6流速对薄膜生长速度、微观结构、薄膜晶向、光学透过率、光学禁带宽度、电阻率、表面粗糙度等特征参量的影响,经过优化实验条件,获得薄膜电阻率在10-3Ω·cm量级,可见光区域光学透过率在85%以上,成功制备低电阻率高光学透过率的ZnO透明导电薄膜.

关 键 词:光学透过率  电阻率  透明导电薄膜(TEO)

CHARACTERISTICS AND GROWTH OF ZnO:B THIN FILMS BY MOCVD PROCESS
Meng Fanying,Jiang Minlin,Yu Yuebo,Hu Yu. CHARACTERISTICS AND GROWTH OF ZnO:B THIN FILMS BY MOCVD PROCESS[J]. Acta Energiae Solaris Sinica, 2008, 29(8)
Authors:Meng Fanying  Jiang Minlin  Yu Yuebo  Hu Yu
Affiliation:Meng Fanying Jiang Minlin Yu Yuebo Hu Yu (Institute of Solar Energy,Physical Department,Shanghai Jiaotong University,Shanghai 200240,Chia)
Abstract:Boron-doped ZnO thin films were deposited on the fused silicon substrates by MOCVD system in this work.The samples were fabricated with various growth temperatures and various flow rates of B_2H_6.Based on the measurement of XRD,SEM,AFM,Hall Effect,and optical transmittance and reflectivity,the characteristics of the thin films,including the crystal plane,optical transmittance,optical band gap energy,resistivity,roughness,were investigated.As a result of optimizing the experimental parameters,the dectrical ...
Keywords:ZnO  B  MOCVD
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