Structure and surface elemental state analysis of polyimide resin film after carbonization and graphitization |
| |
| Authors: | Shuo Zhao Zhi‐qiang Shi Cheng‐yang Wang Ming‐ming Chen |
| |
| Affiliation: | 1. School of Chemical Engineering and Technology, Tianjin University, Tianjin 300072, China;2. Author introduction: Shuo Zhao (1982‐), female, Ph. D. Student, engaged in the research of preparation and application of carbon electrode material. |
| |
| Abstract: | The carbon materials prepared from polyimide (PI) resin film were investigated by TG‐DTG, X‐ray powder diffraction (XRD), and X‐ray photoelectron spectroscopy (XPS) analysis. TG‐DTG study revealed that the weight loss of PI resin film during carbonization occurred in three stages, and the most serious changes occurred at 605.5°C. XRD results indicated that a disorder structure occurred after the carbonization at 600°C and graphite crystallite appeared gradually with increasing the temperature. And PI resin film still presented some characteristics of nongraphitizing carbon, after graphitizing at 2600°C. XPS analysis identified that pyrrole type nitrogen was a main component of surface nitrogen atoms after carbonization. When the temperature reached 2600°C, nitrogen atoms disappeared totally; the reason why oxygen atoms still existed in the material at so high temperature was our subject of interesting matter in the later study. © 2008 Wiley Periodicals, Inc. J Appl Polym Sci, 2008 |
| |
| Keywords: | polyimide film resin TGA structure surface elements state |
|
|
