An X-ray topographic assessment of cadmium mercury telluride |
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Authors: | K L Bye |
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Affiliation: | (1) Philips Research Laboratories, Redhill, Surrey, UK |
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Abstract: | This paper describes an X-ray topographic (Berg-Barrett) assessment of cadmium mercury telluride grown by the Bridgman and cast-recrystallize-anneal (CRA) methods. Reflection topographs reveal that the Bridgman material studied consists of large numbers of small grains (0.05 to 0.6 mm) with misorientations from 1 to 9 minutes per grain. In contrast, the CRA material studied had only a few grain boundaries and features consistent with a strained lattice, possibly caused by compositional variations. |
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