| 中波HgCdTe光导探测器组件的故障树和失效研究 |
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| 引用本文： | 王韡,许金通,周青,张立瑶,李向阳.中波HgCdTe光导探测器组件的故障树和失效研究[J].半导体光电,2012,33(5):627-631. |
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| 作者姓名： | 王韡 许金通 周青 张立瑶 李向阳 |
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| 作者单位： | 中国科学院上海技术物理研究所,上海200083 中国科学院研究生院,北京100039;中国科学院上海技术物理研究所,上海,200083 |
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| 基金项目： | 国家自然科学基金项目(60907048);上海市自然科学基金项目(10ZR1434500) |
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| 摘 要： | 讨论了近室温工作的HgCdTe中波光导探测器组件的可靠性问题,包括组件封装失效、引线键合失效和探测器的性能衰减等。通过收集探测器组件的失效信息,对其失效物理化学机制、制造工艺和探测器参数进行了分析,建立了组件的故障树(FTA),为探测器组件的失效分析提供了理论依据。由FTA定性分析得出探测器组件FTA的最小割集;计算了顶事件的失效几率。通过计算底事件概率重要度,得出组件封装失效是探测器组件失效的主要故障途径;同时实验发现,失效组件探测器的少子寿命值有较大的衰减,这可能起源于失效探测器的表面钝化层退化。
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| 关 键 词： | 碲镉汞 探测器组件 故障树 顶事件失效几率 |
| 收稿时间： | 3/7/2012 12:00:00 AM |
Study on HgCdTe Detector Assemble Fault Tree and Failure Analysis |
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| WANG Wei,XU Jintong,ZHOU Qing,ZHANG Liyao and LI Xiangyang>/sup>.Study on HgCdTe Detector Assemble Fault Tree and Failure Analysis[J].Semiconductor Optoelectronics,2012,33(5):627-631. |
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| Authors: | WANG Wei XU Jintong ZHOU Qing ZHANG Liyao and LI Xiangyang>/sup> |
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| Affiliation: | 1(1.Shanghai Institute of Technical Physics,Chinese Academy of Sciences,Shanghai 200083,CHN; 2.Graduate University of the Chinese Academy of Sciences,Beijing 100039,CHN) |
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| Abstract: | Discussed are the reliability problems of HgCdTe(MCT) infrared photoconductive detectors working at near room temperature,including package failure,chip bonding failure and performance attenuation.Based on collecting the failure data of the detectors,fault tree analysis(FTA) was built by analyzing the failure mechanism of physics and chemistry,manufacturing process and parameters of the detectors.Minimal cut sets of FTA were obtained from qualitative analysis and the failure probability of top event was calculated.The failure modes in detectors,structures and process were analyzed. |
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| Keywords: | MCT detector system fault tree analysis top event |
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