Analytical solution for impedance change due to flaws in eddy current testing |
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| Authors: | Jae-yel Yi Sekyung Lee |
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| Affiliation: | (1) Korea Standards Research Institute, P.O. Box 3, Taedok Science Town, Chungnam, Korea |
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| Abstract: | Green's function is used in order to derive the analytical solution for the change in impedance due to a presence of the flaws in a conductor. This solution is applied to a cylindrical flaw and a spherical flaw whose radii are much smaller than the radius of the test coil. For both cases, the change in impedance is obtained within Born's limit. |
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| Keywords: | Eddy current impedance flaw Green's function Born's limit NDE |
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